BS-EN-60749-22 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-22 - 2003 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Climate;Bonding;Electronic equipment and components;Environmental testing;Mechanical testing;Integrated circuits;Strength of materials;Semiconductor devices

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Document Number

BS EN 60749-22:2003

Revision Level

2003 EDITION

Status

Current

Publication Date

July 4, 2003

Replaces

BS EN 60749:1999

Page Count

24

ISBN

0580421996

International Equivalent

IEC 60749-22:2002;EN 60749-22:2003;IEC 62317-9:2006/AMD1:2007

Committee Number

EPL/47