BS-EN-60749-21 › Semiconductor devices. Mechanical and climatic test methods
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Environmental testing;Solderability testing;Soldering;Semiconductor devices;Thermal testing;Surface mounting devices;Integrated circuits;Electronic equipment and components;Mechanical testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-21:2011
Revision Level
2011 EDITION
Status
Current
Publication Date
Aug. 31, 2011
Replaces
BS EN 60749-21:2005
Page Count
26
ISBN
9780580691157
International Equivalent
EN 60749-21:2011;IEC 60749-21:2011
Committee Number
EPL/47