BS-EN-60749-20-1 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-20-1
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2009 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Mechanical testing;Transportation;Semiconductor devices;Electronic equipment and components;Damp-heat tests;Integrated circuits;Climate;Environmental testing;Labelling (process);Soldering;Environment (working);Thermal testing;Surface mounting devices;Materials handling;Packaging
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-20-1:2009
Revision Level
2009 EDITION
Status
Current
Publication Date
July 31, 2009
Page Count
38
ISBN
9780580546013
International Equivalent
EN 60749-20-1:2009;IEC 60749-20-1:2009
Committee Number
EPL/47