BS-EN-60749-19 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-19
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2003 EDITION
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CURRENT
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Included in this current edition are the following subparts:
2003 EDITION - June 20, 2003
2003 EDITION AMENDMENT 1 - Oct. 1, 2010
2003 EDITION AMENDMENT 1 - Oct. 1, 2010
Keywords
Integrated circuits;Substrates (insulating);Quality control;Environmental testing;Strength of materials;Semiconductor devices;Shear testing;Shear strength;Electrical components;Climate;Mechanical testing;Electrical equipment;Electronic equipment and components
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-19:2003+A1:2010
Revision Level
2003 EDITION
Status
Current
Publication Date
Oct. 31, 2010
Replaces Notes
BS EN 60749:1999
Page Count
10
ISBN
9780580687457
International Equivalent
EN 60749-19:2003/A1:2010;IEC 60749-19:2003/AMD1:2010
Committee Number
EPL/47