BS-EN-60749-18 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-18 - AMD 14531 - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Mechanical testing;Electronic equipment and components;Gamma-radiation;Space technology;Cobalt;Military engineering;Semiconductor devices;Environmental testing;Annealing;Integrated circuits;Ionizing radiation;Climate

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Document Number

BS-EN-60749-18

Revision Level

AMD 14531

Status

Superseded

Publication Date

July 1, 2003

International Equivalent

EN 60749-18:2003;IEC 60749-18:2002

Committee Number

EPL/47