BS-EN-60749-17 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-17 - 2003 EDITION - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Irradiation;Electronic equipment and components;Destructive testing;Climate;Neutrons;Military equipment;Integrated circuits;Military engineering;Dosimeters;Radiation measurement;Environmental testing;Mechanical testing;Nuclear particles;Space technology components;Degradation;Semiconductor devices

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Document Number

BS EN 60749-17:2003

Revision Level

2003 EDITION

Status

Superseded

Publication Date

June 29, 2004

Replaced By

BS EN IEC 60749-17:2019

Page Count

10

ISBN

0580420639

International Equivalent

EN 60749-17:2003;IEC 60749-17:2003

Committee Number

EPL/47