BS-EN-60749-16 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-16
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2003 EDITION
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CURRENT
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Included in this current edition are the following subparts:
2003 EDITION - June 19, 2003
AMD 15224 - June 24, 2004
AMD 15224 - June 24, 2004
Keywords
Climate;Electronic equipment and components;Environmental testing;Acoustic measurement;Mechanical testing;Holes;Solders;Semiconductor devices;Wires;Non-destructive testing;Noise (spurious signals);Vibration testing;Particulate materials;Integrated circuits;Ceramics
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Document Number
BS EN 60749-16:2003
Revision Level
2003 EDITION
Status
Current
Publication Date
June 24, 2004
Page Count
10
ISBN
0580420620
International Equivalent
EN 60749-16:2003;IEC 60749-16:2003
Committee Number
EPL/47