BS-EN-60749-15 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-15 - 2010 EDITION CORRIGENDUM 1 - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Mechanical testing;Solderability testing;Climate;Slots;Destructive testing;Encapsulated;Electronic equipment and components;Holes;Integrated circuits;Semiconductor devices;Thermal testing;Soldering;Environmental testing

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-15

Revision Level

2010 EDITION CORRIGENDUM 1

Status

Superseded

Publication Date

June 1, 2011

International Equivalent

IEC 60749-15:2003;EN 60749-15:2003

Committee Number

EPL/47