BS-EN-60749-14 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-14 - 2003 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Testing conditions;Semiconductor devices;Torque;Qualification approval;Electronic equipment and components;Mechanical testing;Fatigue testing;Destructive testing;Tensile testing;Interfaces;Defects;Bend testing;Environmental testing;Climate;Semiconductors;Integrated circuits

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Document Number

BS EN 60749-14:2003

Revision Level

2003 EDITION

Status

Current

Publication Date

Dec. 15, 2003

Replaces Notes

BS EN 60749:1999

Page Count

18

ISBN

0580430820

International Equivalent

IEC 60749-14:2003;EN 60749-14 (IEC 60749-14:2003) AS;EN 60068-2-13:1999

Committee Number

EPL/47