BS-EN-60749-12 › Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency

BS-EN-60749-12 - RENUMBERED BS-EN-IEC-60749-12 - CURRENT
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Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency

Keywords

Vibration testing;Semiconductor devices;Integrated circuits;Electronic equipment and components;Climate;Environmental testing;Mechanical testing;Destructive testing;Frequencies;Variable

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-12

Revision Level

RENUMBERED BS-EN-IEC-60749-12

Status

Current

Publication Date

April 1, 2018

International Equivalent

IEC 60749-12:2002;EN 60749-12 (IEC 60749-12:2002) AS

Committee Number

EPL/47