BS-EN-60749-11 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-11
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2002 EDITION
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CURRENT
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Included in this current edition are the following subparts:
2002 EDITION - Sept. 24, 2002
AMD 14681 - Oct. 24, 2003
AMD 14681 - Oct. 24, 2003
Keywords
Environmental testing;Integrated circuits;Mechanical testing;Temperature measurement;Electronic equipment and components;Destructive testing;Temperature;Semiconductor devices;Climate;Thermal testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-11:2002
Revision Level
2002 EDITION
Status
Current
Publication Date
Oct. 24, 2003
Replaces Notes
BS EN 60749:1999
Page Count
12
ISBN
0580403955
International Equivalent
IEC 60749-11:2002;EN 60749-11 (IEC 60749-11:2002) AS
Committee Number
EPL/47