BS-EN-60749-10 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-10 - AMD 14112 - CANCELLED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Integrated circuits;Destructive testing;Electronic equipment and components;Mechanical shock;Environmental testing;Climate;Mechanical testing;Impact testing;Semiconductor devices

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-10

Revision Level

AMD 14112

Status

Cancelled

Publication Date

Sept. 17, 2002

International Equivalent

EN 60749-10 (IEC 60749-10:2002) AS;IEC 60749-10:2002

Committee Number

EPL/47