BS-EN-60749-1 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-1 - 2003 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Environmental testing;Testing conditions;Semiconductor devices;Integrated circuits;Mechanical testing;Electronic equipment and components;Climate

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Document Number

BS EN 60749-1:2003

Revision Level

2003 EDITION

Status

Current

Publication Date

July 7, 2003

Replaces

BS EN 60749:1999

Page Count

12

ISBN

0580421988

International Equivalent

EN 60749-1 (IEC 60749-1:2002) AS;IEC 60749-1:2002

Committee Number

EPL/47