BS-EN-165000-2 › Film and hybrid integrated circuits

BS-EN-165000-2 - 1996 EDITION - CURRENT


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Film and hybrid integrated circuits

Keywords

Microscopic analysis,Flaw detection,Etch inspection,Assessed quality,Sonic testing,Hybrid integrated circuits,Capability approval,Approval testing,Radiographic testing,Examination (quality assurance),Quality assurance systems,Definitions,Visual inspection (testing),Quality assurance,Electronic equipment and components,Electrical connections,Macroscopic examination,Integrated film circuits,Integrated circuits

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

BS EN 165000-2:1996

Revision Level

1996 EDITION

Status

Current

Publication Date

Oct. 15, 1996

Page Count

32

ISBN

0580261824

International Equivalent

EN 165000-2:1996

Committee Number

EPL/47