BS-CECC-90000-1 › Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection

BS-CECC-90000-1 - 1983 EDITION - SUPERSEDED
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Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection

Keywords

Defects;Particle size distribution;Assessed quality;Specification (approval);Passivation;Microscopic analysis;Circuits;Quality control;Approval testing;Metallizing;Monolithic integrated circuits;Surface defects;Qualification approval;Integrated circuits;Visual inspection (testing);Inspection;Quality assurance systems;Testing conditions;Electronic equipment and components

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

BS CECC 90000:Addendum No. 1:1983

Revision Level

1983 EDITION

Status

Superseded

Publication Date

July 29, 1983

Page Count

50

ISBN

0580133575

International Equivalent

CECC 90000

Committee Number

EPL/47