BS-6493-1.3 › Semiconductor devices. Discrete devices. Recommendations for signal (including switching) and regulator diodes

BS-6493-1.3 - AMD 8204 - SUPERSEDED -- See the following: BS-IEC-60747-3
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Semiconductor devices. Discrete devices. Recommendations for signal (including switching) and regulator diodes

Keywords

Charge measurement,Definitions,Letters (symbols),Semiconductor diodes,Ratings,Switches,Electrical properties and phenomena,Failure (quality control),Electrical conductance,Electronic equipment and components,Capacitance measurement,Resistance measurement,Diodes,Symbols,Endurance testing,Voltage-reference diodes,Voltage measurement,Power losses,Current measurement,Circuits,Power measurement (electric),Efficiency,Performance testing,Electrical testing,Noise (spurious signals),Test equipment,Electrical measurement,Signal diodes,Semiconductor devices,Testing conditions

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31.080.10 (Diodes)

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Document Number

BS-6493-1.3

Revision Level

AMD 8204

Status

Superseded

Publication Date

June 1, 1994

International Equivalent

IEC 60747-3:1985

Committee Number

EPL/47