ASTM-F1191 › Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)

ASTM-F1191 - 1988 EDITION - SUPERSEDED
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Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
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Keywords

ICS Number Code 31.080.01 (Semi-conductor devices in general)

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

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31.080.01 (Semiconductor devices in general)

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Document Number

ASTM-F1191-88

Revision Level

1988 EDITION

Status

Superseded

Modification Type

Withdrawn

Publication Date

Oct. 31, 1988

Document Type

Guide

Page Count

7 pages