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1.1 This test method provides a procedure for measuring the electromagnetic (EM) shielding effectiveness (SE) of a planar material for a plane, far-field EM wave. From the measured data, near-field SE values can be calculated for magnetic (H) sources for electrically thin specimens.2^,3 Electric (E) field SE values are also able to be calculated from this same far-field data, but their validity and applicability have not been established.

1.2 The measurement method is valid over a frequency range of 30 MHz to 1.5 GHz. These limits are not exact, but are based on decreasing displacement current as a result of decreased capacitive coupling at lower frequencies and on overmoding (excitation of modes other than the transverse electromagnetic mode (TEM)) at higher frequencies for the size of specimen holder described in this test method. Select any number of discrete frequencies within this range. For electrically thin, isotropic materials with frequency independent electrical properties of conductivity, permittivity, and permeability, measurements will possibly be needed at only a few frequencies as the far-field SE values will be independent of frequency. If the material is not electrically thin or if any of the parameters vary with frequency, make measurements at several frequencies within the band of interest.

1.3 This test method is not applicable to cables or connectors.

1.4 Units—The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

4.1 This test method applies to the measurement of SE of planar materials under normal incidence, far-field, plane-wave conditions (E and H tangential to the surface of the material).

4.2 The uncertainty of the measured SE values is a function of material, mismatches throughout the transmission line path, dynamic range of the measurement system, and the accuracy of the ancillary equipment. An uncertainty analysis is given in Appendix X1 to illustrate the probability of uncertainty achieved by an experienced operator using good equipment. Deviations from the procedure in this test method will increase this uncertainty.

4.3 Approximate near-field values of SE can be calculated for both E or H sources by using measured values of far-field SE. A program can be generated from the source code in Appendix X2 that is suitable for use on a personal computer.

4.4 This test method measures the net SE caused by reflection and absorption. The reflected and absorbed power measurement is accomplished by the addition of a calibrated bidirectional coupler to the input of the holder.